共 64 条
[11]
Extremely scaled silicon nano-CMOS devices
[J].
PROCEEDINGS OF THE IEEE,
2003, 91 (11)
:1860-1873
[12]
Compano R., 2000, TECHNOLOGY ROADMAP N
[15]
FORSHAW M, 2001, MICROELECTRONICS ADV
[16]
GEROUSIS V, 2003, P IEEE CUSTOM INT CI
[18]
MULTI-THRESHOLD THRESHOLD ELEMENTS
[J].
IEEE TRANSACTIONS ON ELECTRONIC COMPUTERS,
1966, EC15 (01)
:45-&
[19]
Toward design technology in 2020: Trends, issues, and challenges
[J].
ISVLSI 2003: IEEE COMPUTER SOCIETY ANNUAL SYMPOSIUM ON VLSI, PROCEEDINGS: NEW TRENDS AND TECHNOLOGIES FOR VLSI SYSTEMS DESIGN,
2003,
:3-4
[20]
Hawkins C, 2003, INT SYM DEFEC FAU TO, P267