Trends and challenges in VLSI circuit reliability

被引：359

作者：

Constantinescu, C ^{[1
]}

机构：

[1] Intel Corp, Hillsboro, OR 97124 USA

来源：

IEEE MICRO | 2003年 / 23卷 / 04期

关键词：

D O I：

10.1109/MM.2003.1225959

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

DEEP-SUBMICRON TECHNOLOGY IS HAVING A SIGNIFICANT IMPACT ON PERMANENT, INTERMITTENT, AND TRANSIENT CLASSES OF FAULTS. THIS ARTICLE DISCUSSES THE MAIN TRENDS AND CHALLENGES IN CIRCUIT RELIABILITY, AND EXPLAINS EVOLVING TECHNIQUES FOR DEALING WITH THEM.

引用

页码：14 / 19

页数：6

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