Bow-tie optical antenna probes for single-emitter scanning near-field optical microscopy

被引：99

作者：

Farahani, Javad N.

Eisler, Hans-Juergen

Pohl, Dieter W.

Pavius, Michael

Flueckiger, Philippe

Gasser, Philippe

Hecht, Bert

机构：

[1] Univ Basel, Inst Phys, Natl Ctr Competence Res Nanoscale Sci, Nanoopt Grp, CH-4056 Basel, Switzerland

[2] Ecole Polytech Fed Lausanne, Ctr MicroNano Technol, CH-1015 Lausanne, Switzerland

[3] Swiss Fed Labs Mat Testing & Res, EMPA, Elect Metrol Lab, CH-8600 Dubendorf, Switzerland

来源：

NANOTECHNOLOGY | 2007年 / 18卷 / 12期

关键词：

D O I：

10.1088/0957-4484/18/12/125506

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

A method for the fabrication of bow-tie optical antennas at the apex of pyramidal Si3N4 atomic force microscopy tips is described. We demonstrate that these novel optical probes are capable of sub-wavelength imaging of single quantum dots at room temperature. The enhanced and confined optical near-field at the antenna feed gap leads to locally enhanced photoluminescence (PL) of single quantum dots. Photoluminescence quenching due to the proximity of metal is found to be insignificant. The method holds promise for single quantum emitter imaging and spectroscopy at spatial resolution limited by the engineered antenna gap width exclusively.

引用

页数：4

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