Atomic scattering as a probe of polymer surface and thin film dynamics

被引:11
作者
Freedman, M. A.
Rosenbaum, A. W.
Sibener, S. J.
机构
[1] Univ Chicago, James Franck Inst, Chicago, IL 60637 USA
[2] Univ Chicago, Dept Chem, Chicago, IL 60637 USA
关键词
D O I
10.1103/PhysRevB.75.113410
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Collisional energy transfer at the surface of poly(methyl methacrylate) thin films on SiOx/Si was investigated using low-energy neutral helium atom scattering. Analysis of spectra in two scattering regimes yields results consistent with the hypothesis that thinner films are stiffer, suggesting that for highly nanoconfined films, polymer-substrate interactions influence vibrational dynamics at the polymer-vacuum interface. Specifically, thinner films are found to have lower mean-square displacements and decreased annihilation events as compared to thicker films. The scattering spectra are fit well by a semiclassical scattering model, though deviations arise at sample temperatures near the bulk glass transition. We have found helium atom scattering to be a sensitive probe of the vibrational dynamics of the polymer thin film surface. This technique holds promise for the exploration of glassy dynamics of polymer thin films.
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页数:4
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