Electrical and optical properties of semi-insulating GaN

被引:13
作者
Look, DC
Reynolds, DC
Jones, RL
Kim, W
Aktas, O
Botchkarev, A
Salvador, A
Morkoc, H
机构
[1] USAF, WRIGHT LAB, WRIGHT PATTERSON AFB, OH 45433 USA
[2] UNIV ILLINOIS, MAT RES LAB, URBANA, IL 61801 USA
[3] UNIV ILLINOIS, COORDINATED SCI LAB, URBANA, IL 61801 USA
来源
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY | 1997年 / 44卷 / 1-3期
关键词
light emitting diodes; molecular beam epitaxy; photoluminescence;
D O I
10.1016/S0921-5107(96)01803-X
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Molecular-beam-epitaxial (MBE) GaN layers can be made semi-insulating (SI) by using a high N flux during growth. For growth at low N flux, the samples have high concentrations (>10(18) cm(-3)) of shallow donors and shallow accepters, and also contain a deep center producing a yellow band (2.2 eV) in photoluminescence (PL). For growth at high N flux, the PL lines attributed to shallow accepters and the yellow band disappear, and the only remaining lines are due to the ground and excited states of the free-exciton A and B bands. The SI material does not produce a measurable Hall effect: and the conduction mechanism is assigned to hopping between deep defects. Using arguments from stoichiometry and theory, we tentatively assign the shallow donors, shallow accepters, and deep center to the N vacancy, Ga-antisite/Ga-vacancy complex, and Ga antisite, respectively. (C) 1997 Elsevier Science S.A.
引用
收藏
页码:423 / 426
页数:4
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