共 45 条
Direct electron detectors for electron microscopy
被引:14
作者:
Faruqi, A. R.
[1
]
机构:
[1] MRC, Mol Biol Lab, Cambridge CB2 2QH, England
来源:
ADVANCES IN IMAGING AND ELECTRON PHYSICS, VOL 145
|
2007年
/
145卷
基金:
英国工程与自然科学研究理事会;
英国医学研究理事会;
关键词:
D O I:
10.1016/S1076-5670(06)45002-3
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
Some of the design principles and potential applications of direct-detection detectors for image recording and storage in electron microscopy (EM) are discussed. The major direct-detection detector technologies include hybrid pixel detectors (HPD) and monolithic active pixel sensors (MAPS). HPDs use separate pixellated detector and readout electronics chips and are able to acquire data without adding any noise. The design process of MAPS simplifies the design process and allows the integration of detector and readout on the same chip. Both detectors are based on the latest complementary metal oxide semiconductor (CMOS) design technologies, with significant potential to be used in EM applications. It is also found that the significance of direct-detection detectors have increased with growing application of EM for extensive data collection.
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页码:55 / 93
页数:39
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