Standard sample probes for characterizing optical apertures in near-field scanning optical microscopy

被引：4

作者：

Imhof, JM ^{[1
]}

Kwak, ES ^{[1
]}

Vanden Bout, DA ^{[1
]}

机构：

[1] Univ Texas, Texas Mat Inst, Ctr Nano & Mol Sci & Technol, Dept Chem & Biochem, Austin, TX 78712 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2003年 / 74卷 / 04期

关键词：

D O I：

10.1063/1.1556951

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A quick, cost effective, semiquantitative means for gauging the quality of near-field scanning optical microscopy (NSOM) probe apertures has been demonstrated by employing a nanoperforated thin metal film standard sample. Small 182 nm holes were created by evaporating gold over dispersed latex spheres with subsequent removal of the spheres. The size of the NSOM aperture can be determined from a deconvolution of the image size and the known sample size and geometry. Results from the standard correlate well with aperture size measurements made from scanning electron micrographs. (C) 2003 American Institute of Physics.

引用

收藏

页码：2424 / 2428

页数：5

相关论文

共 24 条

[1] NEAR-FIELD OPTICS - MICROSCOPY, SPECTROSCOPY, AND SURFACE MODIFICATION BEYOND THE DIFFRACTION LIMIT [J].

BETZIG, E ;

TRAUTMAN, JK .

SCIENCE, 1992, 257 (5067) :189-195

[2] BREAKING THE DIFFRACTION BARRIER - OPTICAL MICROSCOPY ON A NANOMETRIC SCALE [J].

BETZIG, E ;

TRAUTMAN, JK ;

HARRIS, TD ;

WEINER, JS ;

KOSTELAK, RL .

SCIENCE, 1991, 251 (5000) :1468-1470

[3] Single molecule emission characteristics in near-field microscopy [J].

Bian, RX ;

Dunn, RC ;

Xie, XS ;

Leung, PT .

PHYSICAL REVIEW LETTERS, 1995, 75 (26) :4772-4775

[4] Near-field scanning optical microscopy [J].

Buratto, SK .

CURRENT OPINION IN SOLID STATE & MATERIALS SCIENCE, 1996, 1 (04) :485-492

[5] Near-field scanning optical microscopy [J].

Dunn, RC .

CHEMICAL REVIEWS, 1999, 99 (10) :2891-+

[6] Electroluminescence in conjugated polymers [J].

Friend, RH ;

Gymer, RW ;

Holmes, AB ;

Burroughes, JH ;

Marks, RN ;

Taliani, C ;

Bradley, DDC ;

Dos Santos, DA ;

Brédas, JL ;

Lögdlund, M ;

Salaneck, WR .

NATURE, 1999, 397 (6715) :121-128

[7] Noncontact scanning force microscopy based on a modified tuning fork sensor [J].

Göttlich, H ;

Stark, RW ;

Pedarnig, JD ;

Heckl, WM .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2000, 71 (08) :3104-3107

[8] Near-field scanning optical microscopy cross-sectional measurements of crystalline GaAs solar cells [J].

Herndon, MK ;

Bradford, WC ;

Collins, RT ;

Hawkins, BE ;

Kuech, TF ;

Friedman, DJ ;

Kurtz, SR .

APPLIED PHYSICS LETTERS, 2000, 77 (01) :100-102

[9] Probing single molecule orientations in model lipid membranes with near-field scanning optical microscopy [J].

Hollars, CW ;

Dunn, RC .

JOURNAL OF CHEMICAL PHYSICS, 2000, 112 (18) :7822-7830

[10] Near-field scanning optical microscopy studies of electronic and photonic materials and devices [J].

Hsu, JWP .

MATERIALS SCIENCE & ENGINEERING R-REPORTS, 2001, 33 (01) :1-50