Influence of the aminated conditions on the pH sensitivity of silica and amorphous silicon film

被引:1
作者
Baccar, ZM
Jaffrezic-Renault, N
Fourmond, E
Lemiti, M
Grekov, FF
机构
[1] Ecole Cent Lyon, UMR 5621, IFoS, F-69131 Ecully, France
[2] Inst Natl Sci Appl Lyon, UMR 5511, LPM, F-69621 Villeurbanne, France
[3] St Petersburg State Univ, EMT Dept, St Petersburg 195251, Russia
关键词
D O I
10.1016/S0955-2219(97)00052-6
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Silicon nitride has been widely used as a pH sensitive membrane of the ion sensitive field effect transistor (ISFET) thanks to the high reactivity of the SiNH2 sites to the H+ ions. In this paper, we report experimental results on the H+ sensitivity of silica and amorphous silicon aminated films, obtained by the photo-CVD. We have studied the dependence of their response to pH as a function of the time and the temperature of amination of the film. The response of the aminated films (silica and amorphous silicon) is quasi-Nernstian for amination exposure time higher than 1 min, deposited at temperature lower than 200 degrees C. A theoretical model of deposition is presented. It can explain the influence of the deposition conditions. Published by Elsevier Science Limited.
引用
收藏
页码:2021 / 2024
页数:4
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