Growth of GaN epitaxial layers on sapphire with preheated ammonia and their structural and optoelectronic properties

被引:10
作者
Kim, HJ
Kwon, SY
Yim, S
Na, H
Kee, B
Yoon, E [1 ]
Kim, J
Park, SH
Jeon, H
Kim, S
Seo, JH
Park, K
Seon, MS
Sone, C
Nam, OH
Park, Y
机构
[1] Seoul Natl Univ, Sch Mat Sci & Engn, Seoul 151742, South Korea
[2] Seoul Natl Univ, Sch Phys, Seoul 151742, South Korea
[3] Samsung Adv Inst Technol, Suwon 440600, South Korea
[4] Hanvac Corp, Yusong Gu, Taejon 305380, South Korea
关键词
epitaxy; MOCVD; ammonia preheater; GaN; nitride semiconductor;
D O I
10.1016/S1567-1739(02)00224-9
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
GaN epitaxial layers were grown by metalorganic chemical vapor deposition with preheated ammonia as a group V source. The growth rates of GaN epilayers were little affected when ammonia preheater temperature was varied from room temperature to 1000 degreesC, however, their electrical properties as well as source materials utilization efficiency was significantly improved by using preheated ammonia. GaN epilayers grown with preheated ammonia showed excellent structural and optical properties. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:351 / 354
页数:4
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