AFM studies of polypyrrole film surface morphology - II. Roughness characterization by the fractal dimension analysis

被引：59

作者：

Silk, T ^{[1
]}

Hong, Q

Tamm, J

Compton, RG

机构：

[1] Tartu State Univ, Inst Phys Chem, EE-2400 Tartu, Estonia

[2] Univ Oxford, Phys & Theoret Chem Lab, Oxford OX1 3QZ, England

来源：

SYNTHETIC METALS | 1998年 / 93卷 / 01期

关键词：

polypyrrole; atomic force microscopy; surface morphology; fractal dimensions;

D O I：

10.1016/S0379-6779(98)80132-X

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The fractal dimension of electrogenerated polypyrrole films with chloride, sulfate, perchlorate and dodecylsulfate (DDS) anions as dopants is investigated by using atomic force microscopy under ex situ conditions. The results for firms both as-prepared and after potentiodynamic cycling in various supporting electrolytes is presented and discussed. (C) 1998 Elsevier Science S.A.

引用

页码：65 / 71

页数：7

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