Low-energy electron diffraction study of the phase transition of Si(001) surface below 40 k

被引:38
作者
Matsumoto, M [1 ]
Fukutani, K [1 ]
Okano, T [1 ]
机构
[1] Univ Tokyo, Inst Ind Sci, Meguro Ku, Tokyo 1538505, Japan
关键词
D O I
10.1103/PhysRevLett.90.106103
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The phase transition of Si(001) surface below 40 K was studied by low-energy electron diffraction (LEED). The temperature dependence of the intensities and widths of the quarter order diffraction spots and LEED intensity versus electron energy curves (I-V curves) were obtained in the temperature region from 20 to 300 K. While the spot intensities of the quarter order spots decrease and the widths broaden, the I-V curves do not change so much below 40 K. This clearly shows that a phase transition occurs from an ordered phase above 40 K to a disordered phase below 40 K.
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页数:4
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共 27 条
[1]   LOW-ENERGY ION-SCATTERING FROM THE SI(001) SURFACE [J].
AONO, M ;
HOU, Y ;
OSHIMA, C ;
ISHIZAWA, Y .
PHYSICAL REVIEW LETTERS, 1982, 49 (08) :567-570
[2]   Ground-state reconstruction of the Si(001) surface: symmetric versus buckled dimers [J].
Bokes, P ;
Stich, I ;
Mitas, L .
CHEMICAL PHYSICS LETTERS, 2002, 362 (5-6) :559-566
[3]   ATOMIC AND ELECTRONIC-STRUCTURES OF RECONSTRUCTED SI(100) SURFACES [J].
CHADI, DJ .
PHYSICAL REVIEW LETTERS, 1979, 43 (01) :43-47
[4]   SCANNING TUNNELING MICROSCOPY OF SI(001) [J].
HAMERS, RJ ;
TROMP, RM ;
DEMUTH, JE .
PHYSICAL REVIEW B, 1986, 34 (08) :5343-5357
[5]   p(2 x 2) phase of buckled dimers of Si(100) observed on n-type substrates below 40 K by scanning tunneling microscopy -: art. no. 286104 [J].
Hata, K ;
Yoshida, S ;
Shigekawa, H .
PHYSICAL REVIEW LETTERS, 2002, 89 (28)
[6]   How to fabricate a defect free Si(001) surface [J].
Hata, K ;
Kimura, T ;
Ozawa, S ;
Shigekawa, H .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 2000, 18 (04) :1933-1936
[7]   Role of electronic correlation in the Si(100) reconstruction: A quantum Monte Carlo study [J].
Healy, SB ;
Filippi, C ;
Kratzer, P ;
Penev, E ;
Scheffler, M .
PHYSICAL REVIEW LETTERS, 2001, 87 (01) :1-016105
[8]   PHOTOEMISSION-STUDIES OF INTRINSIC SURFACE-STATES ON SI(100) [J].
HIMPSEL, FJ ;
EASTMAN, DE .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (05) :1297-1299
[9]   ORDER-DISORDER PHASE-TRANSITION ON THE SI(001) SURFACE - CRITICAL ROLE OF DIMER DEFECTS [J].
INOUE, K ;
MORIKAWA, Y ;
TERAKURA, K ;
NAKAYAMA, M .
PHYSICAL REVIEW B, 1994, 49 (20) :14774-14777
[10]   QUANTUM DIFFUSION OF POSITIVE MUONS IN COPPER [J].
KADONO, R ;
IMAZATO, J ;
MATSUZAKI, T ;
NISHIYAMA, K ;
NAGAMINE, K ;
YAMAZAKI, T ;
RICHTER, D ;
WELTER, JM .
PHYSICAL REVIEW B, 1989, 39 (01) :23-41