Temperature-dependent emissivity of silicon-related materials and structures

The results of an ongoing collaborative project between the New Jersey Institute of Technology (NJIT) and SEMATECH on the temperature-dependent emissivity of silicon-related materials and structures are presented in this study, These results have been acquired using a spectral emissometer. This emissometer consists of a Fourier Transform Infra-Red (FTIR) spectrometer designed specifically to facilitate simultaneous measurements of surface spectral emittance and temperature by using optical techniques over the near-and mid-IR spectral range and temperatures ranging from 300 Ii to 2000 Ii, This noncontact, real-time technique has been used to measure radiative properties as a function of temperature and wavelength for a wide range of silicon-related materials and structures, The first results of the temperature and wavelength dependent emissivity and hence refractive index of silicon nitride, in the Literature, is presented in this study.