Thermal gradient in solder joints under electrical-current stressing

被引:30
作者
Shao, TL [1 ]
Chiu, SH
Chen, C
Yao, DJ
Hsu, CY
机构
[1] Natl Chiao Tung Univ, Dept Mat Sci & Engn, Hsinchu 300, Taiwan
[2] Natl Tsing Hua Univ, Inst Microelectromech Syst, Hsinchu 300, Taiwan
[3] Natl Tsing Hua Univ, Dept Power Mech Engn, Hsinchu 300, Taiwan
关键词
SnAg3.5; solder joints; electrical current stressing; thermal gradients;
D O I
10.1007/s11664-004-0164-0
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The thermal gradient and temperature increase in SnAg3.5 solder joints under electrical-current stressing have been investigated by thermal infrared microscopy. Both positive and negative thermal gradients were observed under different stressing conditions. The magnitude of the thermal gradient increases with the applied current. The measured thermal gradients reached 365degreesC/cm as powered by 0.59 A, yet no obvious thermal gradient was observed when the joints were powered less than 0.25 A. The temperature increase caused by joule heating was as high as 54.5degreesC when powered by 0.59 A, yet only 3.7degreesC when stressed by 0.19 A. The location of heat generation and path of heat dissipation are believed to play crucial roles in the thermal gradient. When the major heat source is the Al trace, the thermal gradient in the solder bumps is positive; but it may become negative because the heat generated in the solder itself is more prominent.
引用
收藏
页码:1350 / 1354
页数:5
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