A general relation between the ranges of stability of electrostatic actuators under charge or voltage control

被引:20
作者
Bochobza-Degani, O [1 ]
Elata, D
Nemirovsky, Y
机构
[1] Technion Israel Inst Technol, Dept Elect Engn, Kidron Microelect Res Ctr, IL-32000 Haifa, Israel
[2] Technion Israel Inst Technol, Dept Mech Engn, IL-32000 Haifa, Israel
关键词
Charge control;
D O I
10.1063/1.1536251
中图分类号
O59 [应用物理学];
学科分类号
摘要
Pull-in instability is a crucial effect in electrostatically-actuated microelectromechanical devices. This phenomenon was recently shown to occur under both voltage and charge control. So far, for all known cases, it has been shown that, under charge excitation, electrostatic actuators have a larger range of stability than under voltage excitation. No counter-examples are known, and whether this is a general rule for electrostatic actuators is an open question. In this work, a general proof is presented that shows this is indeed a fundamental rule for general electrostatic actuators. (C) 2003 American Institute of Physics.
引用
收藏
页码:302 / 304
页数:3
相关论文
共 9 条
[1]  
Callen H. B., 1960, THERMODYNAMICS
[2]   Quantum mechanical actuation of microelectromechanical systems by the Casimir force [J].
Chan, HB ;
Aksyuk, VA ;
Kleiman, RN ;
Bishop, DJ ;
Capasso, F .
SCIENCE, 2001, 291 (5510) :1941-1944
[3]  
Hornbeck L. J., 1989, PROC SOC PHOT OPT EN, V1150, P86, DOI 10.1117/12.962188
[4]   Current drive methods to extend the range of travel of electrostatic microactuators beyond the voltage pull-in point [J].
Nadal-Guardia, R ;
Dehé, A ;
Aigner, R ;
Castañer, LM .
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2002, 11 (03) :255-263
[5]   RESONANT GATE TRANSISTOR [J].
NATHANSON, HC ;
NEWELL, WE ;
WICKSTROM, RA ;
DAVIS, JR .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1967, ED14 (03) :117-+
[6]   A methodology and model for the pull-in parameters of electrostatic actuators [J].
Nemirovsky, Y ;
Bochobza-Degani, O .
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2001, 10 (04) :601-615
[7]   Fluid control in multichannel structures by electrocapillary pressure [J].
Prins, MWJ ;
Welters, WJJ ;
Weekamp, JW .
SCIENCE, 2001, 291 (5502) :277-280
[8]   Adjustable responsivity for thermal infrared detectors [J].
Song, WB ;
Talghader, JJ .
APPLIED PHYSICS LETTERS, 2002, 81 (03) :550-552
[9]   Electromechanical instability of microscale structures [J].
Yang, FQ .
JOURNAL OF APPLIED PHYSICS, 2002, 92 (05) :2789-2794