Design, fabrication, and testing of an integrated Si-based light modulator

被引:44
作者
Sciuto, A [1 ]
Libertino, S
Alessandria, A
Coffa, S
Coppola, G
机构
[1] Univ Catania, Dept Phys, I-95129 Catania, Italy
[2] CNR, IMM, Sez Catania, I-95121 Catania, Italy
[3] STMicroelect, DSG R&D, I-95121 Catania, Italy
[4] STMicroelect, Corp R&D, I-95121 Catania, Italy
[5] CNR, IMM, Sez Napoli, I-80125 Naples, Italy
关键词
bipolar transistor; electrooptic modulation; FET; modulators; optoelectronic devices; semiconductor waveguides;
D O I
10.1109/JLT.2003.808608
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have fabricated and characterized a novel Si-based light modulator working at the standard communication wavelength of 1.5 mum. It consists of a three-terminal bipolar mode field effect transistor integrated with a silicon rib waveguide on epitaxial Si wafers. The modulator optical channel is embodied within its vertical electrical channel. Light modulation is achieved moving a plasma of carriers inside and outside the optical channel by properly biasing the control electrode. The carriers produce an increase of the Si absorption coefficient. The devices have been fabricated using clean-room, processing. Detailed electrical characterization and device simulations confirm that strong conductivity modulation and plasma formation in the channel are achieved. The plasma distribution in the device under different bias conditions has been directly derived from emission microscopy analyses. The device performances in terms of modulation depth will be presented.
引用
收藏
页码:228 / 235
页数:8
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