Electrochromic coatings for smart windows

被引:36
作者
Cui, HN
Costa, MF
Teixeira, V
Porqueras, I
Bertran, E
机构
[1] Univ Minho, Phys Ctr, GRF Funct Coatings Grp, P-4800058 Guimaraes, Portugal
[2] Univ Barcelona, Dept Fis Aplicada & Opt, E-08028 Barcelona, Spain
关键词
sputter deposition; sintering; tungsten oxide; indium oxides; tin oxides; surface structure; morphology; roughness; and; topography; X-ray scattering; diffraction; and reflection; visible/ultraviolet absorption spectroscopy;
D O I
10.1016/S0039-6028(03)00457-6
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Electrochromic coatings are finding interesting applications in a wide range of fields. The possibility of controlling the transparency of tungsten oxide (WO3) thin films by the application of small electrical voltages in a reversible way is quite promising and was explored in the work herein reported. Multi-layer films based on WO3 were mainly deposited by reactive dc magnetron sputtering onto glass substrates. The films were analyzed by spectroscopy from the near infrared to the ultraviolet, by the laser triangulation for microtopographic inspection, atomic force microscopy and Xray diffraction. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:1127 / 1131
页数:5
相关论文
共 21 条
[1]   Structure dependent electrochromic behavior of WO3 thin films under dry lithiation [J].
Ashrit, PV .
SOLAR OPTICAL MATERIALS XVI, 1999, 3789 :158-169
[2]   ELECTROCHROMIC AND PHOTOELECTROCHEMICAL BEHAVIOR OF THIN WO3 FILMS PREPARED FROM QUANTIZED COLLOIDAL PARTICLES [J].
BEDJA, I ;
HOTCHANDANI, S ;
CARPENTIER, R ;
VINODGOPAL, K ;
KAMAT, PV .
THIN SOLID FILMS, 1994, 247 (02) :195-200
[3]   Dependence of oxygen flow on optical and electrical properties of DC-magnetron sputtered ITO films [J].
Bender, M ;
Seelig, W ;
Daube, C ;
Frankenberger, H ;
Ocker, B ;
Stollenwerk, J .
THIN SOLID FILMS, 1998, 326 (1-2) :72-77
[4]   NO2 sensitivity of WO3 thin film obtained by high vacuum thermal evaporation [J].
Cantalini, C ;
Sun, HT ;
Faccio, M ;
Pelino, M ;
Santucci, S ;
Lozzi, L ;
Passacantando, M .
SENSORS AND ACTUATORS B-CHEMICAL, 1996, 31 (1-2) :81-87
[5]   Surface inspection by an optical triangulation method [J].
Costa, MFM .
OPTICAL ENGINEERING, 1996, 35 (09) :2743-2747
[6]  
Cui HN, 2001, MECHANICS AND MATERIAL ENGINEERING FOR SCIENCE AND EXPERIMENTS, P292
[7]   Microstructure study of indium tin oxide thin films by optical methods [J].
Cui, HN ;
Teixeira, V ;
Monteiro, A .
VACUUM, 2002, 67 (3-4) :589-594
[8]   The fabrication of dipped CdS and sputtered ITO thin films for photovoltaic solar cells [J].
Cui, HN ;
Xi, SQ .
THIN SOLID FILMS, 1996, 288 (1-2) :325-329
[9]   Characterisation of ZrO2 films prepared by rf reactive sputtering at different O2 concentrations in the sputtering gases [J].
Gao, PT ;
Meng, LJ ;
dos Santos, MP ;
Teixeira, V ;
Andritschky, M .
VACUUM, 2000, 56 (02) :143-148
[10]   Study of ZrO2/Al2O3 multilayers [J].
Gao, PT ;
Meng, LJ ;
dos Santos, MP ;
Teixeira, V ;
Andritschky, M .
VACUUM, 2002, 64 (3-4) :267-273