Characterization of heterogeneities in detector-grade CdZnTe crystals

被引：22

作者：

Duff, M. C. ^{[1
]}

Hunter, D. B. ^{[1
]}

Burger, A. ^{[2
]}

Groza, M. ^{[2
]}

Buliga, V. ^{[2
]}

Bradley, J. P. ^{[3
]}

Graham, G. ^{[3
]}

Dai, Z. R. ^{[3
]}

Teslich, N. ^{[3
]}

Black, D. R. ^{[4
]}

Lanzirotti, A. ^{[5
]}

机构：

[1] Westinghouse Savannah River Co, Savannah River Lab, Aiken, SC 29808 USA

[2] Fisk Univ, Nashville, TN 37208 USA

[3] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA

[4] Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA

[5] Univ Chicago, CARS, Natl Synchrotron Light Source, Brookhaven Natl Lab, Upton, NY 11973 USA

来源：

JOURNAL OF MATERIALS RESEARCH | 2009年 / 24卷 / 04期

基金：

美国能源部; 美国国家科学基金会;

关键词：

CADMIUM ZINC TELLURIDE; DEFECTS; GROWTH; CDTE; PERFORMANCE; SEGREGATION;

D O I：

10.1557/JMR.2009.0165

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Synthetic Cd1-xZnxTe or "CZT" crystals are highly suitable for gamma-spectrometers, operating at room temperature. Secondary phases (SP) within CZT, presumed to be Te metal, have detrimental impacts on the charge collection efficiency of fabricated device. Using analytical techniques rather than arbitrary theoretical definitions, we identify two SP morphologies: (i) many void, 20-mu m "negative" crystals with 65-nm nanoparticle residues of Si, Cd, Zn, and Te and (ii) 20-mu m hexagonal-shaped bodies, which are composites of metallic Te layers with cores of amorphous and polycrystalline CZT material that surround the voids.

引用

页码：1361 / 1367

页数：7

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