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BIPOLAR-TRANSISTOR FABRICATION IN LOW-TEMPERATURE (745-DEGREES-C) ULTRA-LOW-PRESSURE CHEMICAL-VAPOR-DEPOSITED EPITAXIAL SILICON
被引:20
作者
:
BURGER, WR
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT CHEM ENGN,CAMBRIDGE,MA 02139
BURGER, WR
COMFORT, JH
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT CHEM ENGN,CAMBRIDGE,MA 02139
COMFORT, JH
GARVERICK, LM
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT CHEM ENGN,CAMBRIDGE,MA 02139
GARVERICK, LM
YEW, TR
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT CHEM ENGN,CAMBRIDGE,MA 02139
YEW, TR
REIF, R
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,DEPT CHEM ENGN,CAMBRIDGE,MA 02139
REIF, R
机构
:
[1]
MIT,DEPT CHEM ENGN,CAMBRIDGE,MA 02139
[2]
MIT,DEPT MAT SCI & ENGN,CAMBRIDGE,MA 02139
来源
:
IEEE ELECTRON DEVICE LETTERS
|
1987年
/ 8卷
/ 04期
关键词
:
D O I
:
10.1109/EDL.1987.26590
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:168 / 170
页数:3
相关论文
共 8 条
[1]
ELECTRICAL CHARACTERIZATION OF EPITAXIAL SILICON DEPOSITED AT LOW-TEMPERATURES BY PLASMA-ENHANCED CHEMICAL VAPOR-DEPOSITION
BURGER, WR
论文数:
0
引用数:
0
h-index:
0
BURGER, WR
REIF, R
论文数:
0
引用数:
0
h-index:
0
REIF, R
[J].
IEEE ELECTRON DEVICE LETTERS,
1985,
6
(12)
: 652
-
654
[2]
MOSFET CHARACTERISTICS IN LOW-TEMPERATURE PLASMA-ENHANCED CHEMICAL VAPOR-DEPOSITED EPITAXIAL SILICON
BURGER, WR
论文数:
0
引用数:
0
h-index:
0
BURGER, WR
REIF, R
论文数:
0
引用数:
0
h-index:
0
REIF, R
[J].
IEEE ELECTRON DEVICE LETTERS,
1986,
7
(04)
: 206
-
207
[3]
LOW-TEMPERATURE SILICON EPITAXY USING LOW-PRESSURE CHEMICAL VAPOR-DEPOSITION WITH AND WITHOUT PLASMA ENHANCEMENT
DONAHUE, TJ
论文数:
0
引用数:
0
h-index:
0
DONAHUE, TJ
BURGER, WR
论文数:
0
引用数:
0
h-index:
0
BURGER, WR
REIF, R
论文数:
0
引用数:
0
h-index:
0
REIF, R
[J].
APPLIED PHYSICS LETTERS,
1984,
44
(03)
: 346
-
348
[4]
SILICON EPITAXY AT 650-800-DEGREES-C USING LOW-PRESSURE CHEMICAL VAPOR-DEPOSITION BOTH WITH AND WITHOUT PLASMA ENHANCEMENT
DONAHUE, TJ
论文数:
0
引用数:
0
h-index:
0
DONAHUE, TJ
REIF, R
论文数:
0
引用数:
0
h-index:
0
REIF, R
[J].
JOURNAL OF APPLIED PHYSICS,
1985,
57
(08)
: 2757
-
2765
[5]
Grove A. S., 1967, PHYS TECHNOL S, P180
[6]
LOW-TEMPERATURE SILICON EPITAXY BY ULTRAHIGH-VACUUM CHEMICAL VAPOR-DEPOSITION
MEYERSON, BS
论文数:
0
引用数:
0
h-index:
0
MEYERSON, BS
[J].
APPLIED PHYSICS LETTERS,
1986,
48
(12)
: 797
-
799
[7]
THE REDUCTION OF EMITTER-COLLECTOR SHORTS IN A HIGH-SPEED ALL-IMPLANTED BIPOLAR TECHNOLOGY
PARRILLO, LC
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
PARRILLO, LC
PAYNE, RS
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
PAYNE, RS
SEIDEL, TE
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
SEIDEL, TE
ROBINSON, M
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
ROBINSON, M
REUTLINGER, GW
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
REUTLINGER, GW
POST, DE
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
POST, DE
FIELD, RL
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
FIELD, RL
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1981,
28
(12)
: 1508
-
1514
[8]
REIF R, 1986, Patent No. 4579609
←
1
→
共 8 条
[1]
ELECTRICAL CHARACTERIZATION OF EPITAXIAL SILICON DEPOSITED AT LOW-TEMPERATURES BY PLASMA-ENHANCED CHEMICAL VAPOR-DEPOSITION
BURGER, WR
论文数:
0
引用数:
0
h-index:
0
BURGER, WR
REIF, R
论文数:
0
引用数:
0
h-index:
0
REIF, R
[J].
IEEE ELECTRON DEVICE LETTERS,
1985,
6
(12)
: 652
-
654
[2]
MOSFET CHARACTERISTICS IN LOW-TEMPERATURE PLASMA-ENHANCED CHEMICAL VAPOR-DEPOSITED EPITAXIAL SILICON
BURGER, WR
论文数:
0
引用数:
0
h-index:
0
BURGER, WR
REIF, R
论文数:
0
引用数:
0
h-index:
0
REIF, R
[J].
IEEE ELECTRON DEVICE LETTERS,
1986,
7
(04)
: 206
-
207
[3]
LOW-TEMPERATURE SILICON EPITAXY USING LOW-PRESSURE CHEMICAL VAPOR-DEPOSITION WITH AND WITHOUT PLASMA ENHANCEMENT
DONAHUE, TJ
论文数:
0
引用数:
0
h-index:
0
DONAHUE, TJ
BURGER, WR
论文数:
0
引用数:
0
h-index:
0
BURGER, WR
REIF, R
论文数:
0
引用数:
0
h-index:
0
REIF, R
[J].
APPLIED PHYSICS LETTERS,
1984,
44
(03)
: 346
-
348
[4]
SILICON EPITAXY AT 650-800-DEGREES-C USING LOW-PRESSURE CHEMICAL VAPOR-DEPOSITION BOTH WITH AND WITHOUT PLASMA ENHANCEMENT
DONAHUE, TJ
论文数:
0
引用数:
0
h-index:
0
DONAHUE, TJ
REIF, R
论文数:
0
引用数:
0
h-index:
0
REIF, R
[J].
JOURNAL OF APPLIED PHYSICS,
1985,
57
(08)
: 2757
-
2765
[5]
Grove A. S., 1967, PHYS TECHNOL S, P180
[6]
LOW-TEMPERATURE SILICON EPITAXY BY ULTRAHIGH-VACUUM CHEMICAL VAPOR-DEPOSITION
MEYERSON, BS
论文数:
0
引用数:
0
h-index:
0
MEYERSON, BS
[J].
APPLIED PHYSICS LETTERS,
1986,
48
(12)
: 797
-
799
[7]
THE REDUCTION OF EMITTER-COLLECTOR SHORTS IN A HIGH-SPEED ALL-IMPLANTED BIPOLAR TECHNOLOGY
PARRILLO, LC
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
PARRILLO, LC
PAYNE, RS
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
PAYNE, RS
SEIDEL, TE
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
SEIDEL, TE
ROBINSON, M
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
ROBINSON, M
REUTLINGER, GW
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
REUTLINGER, GW
POST, DE
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
POST, DE
FIELD, RL
论文数:
0
引用数:
0
h-index:
0
机构:
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
BELL TEL LABS INC, ALLENTOWN, PA 18103 USA
FIELD, RL
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1981,
28
(12)
: 1508
-
1514
[8]
REIF R, 1986, Patent No. 4579609
←
1
→