NOVEL METHOD OF SEMICONDUCTOR DEVICE MEASUREMENTS

被引：48

作者：

EVERHART, TE

MATTA, RK

WELLS, OC

机构：

来源：

PROCEEDINGS OF THE IEEE | 1964年 / 52卷 / 12期

关键词：

D O I：

10.1109/PROC.1964.3460

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：1642 / &

共 36 条

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