NEW ABSOLUTE REFLECTOMETER

被引：3

作者：

ALMARZOUK, K

JACOBSON, M

PARKS, R

RODGERS, M

机构：

来源：

OPTICAL ENGINEERING | 1982年 / 21卷 / 06期

关键词：

D O I：

10.1117/12.7973017

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

An instrument has been developed for measuring absolute reflectance at near normal incidence in the infrared region of the spectrum. The basic design of the instrument is similar to the Bennett absolute reflectometer except for some differences in implementation. The major sources of systematic errors have been reduced or eliminated. The alignment procedure is described.

引用

页码：976 / 978

页数：3

共 5 条

[1] PRECISION MEASUREMENT OF ABSOLUTE SPECULAR REFLECTANCE WITH MINIMIZED SYSTEMATIC ERRORS [J].