SPECTRUM SUBTRACTION TECHNIQUES IN AUGER-ELECTRON SPECTROSCOPY

被引：22

作者：

GRANT, JT

HOOKER, MP

HAAS, TW

机构：

[1] UNIVERSAL ENERGY SYST INC,MEDWAY,OH 45341

[2] AEROSP RES LABS,WRIGHT PATTERSON AFB,OH 45433

来源：

SURFACE SCIENCE | 1975年 / 51卷 / 01期

关键词：

D O I：

10.1016/0039-6028(75)90257-5

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：318 / 322

页数：5

共 10 条

[1] EFFECT OF MODULATION AMPLITUDE ON ELECTRON-EXCITED AUGER DATA FROM TITANIUM [J].

GRANT, JT ;

HAAS, TW ;

HOUSTON, JE .

SURFACE SCIENCE, 1974, 42 (01) :1-11

[2] QUANTITATIVE COMPARISON OF TI AND TIO SURFACES USING AUGER-ELECTRON AND SOFT-X-RAY APPEARANCE POTENTIAL SPECTROSCOPIES [J].

GRANT, JT ;

HAAS, TW ;

HOUSTON, JE .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (01) :227-230

[3] A STUDY OF RU(0001) AND RH(111) SURFACES USING LEED AND AUGER ELECTRON SPECTROSCOPY [J].

GRANT, JT ;

HAAS, TW .

SURFACE SCIENCE, 1970, 21 (01) :76-&

[4] CORRECTIONS OF AUGER-ELECTRON SIGNAL STRENGTHS FOR MODULATION AMPLITUDE DISTORTION IN A 4-GRID RETARDING POTENTIAL-ENERGY ANALYZER [J].

GRANT, JT ;

HAAS, TW .

SURFACE SCIENCE, 1974, 44 (02) :617-623

[5] CHEMICAL EFFECTS IN AUGER-ELECTRON SPECTROSCOPY [J].

HAAS, TW ;

GRANT, JT ;

DOOLEY, GJ .

JOURNAL OF APPLIED PHYSICS, 1972, 43 (04) :1853-&

[6] SOME PROBLEMS IN ANALYSIS OF AUGER ELECTRON SPECTRA [J].

HAAS, TW ;

GRANT, JT ;

DOOLEY, GJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1970, 7 (01) :43-&

[7] ANALYSIS OF MATERIALS BY ELECTRON-EXCITED AUGER ELECTRONS [J].

HARRIS, LA .

JOURNAL OF APPLIED PHYSICS, 1968, 39 (03) :1419-&

[8] EXACT CORRECTIONS FOR POTENTIAL MODULATION DISTORTION IN AUGER YIELD MEASUREMENTS [J].

HOUSTON, JE .

SURFACE SCIENCE, 1973, 38 (02) :283-291

[9] STUDY OF GRAIN-BOUNDARY FRACTURE SURFACES IN DOPED TUNGSTEN-RHENIUM ALLOYS [J].

SIMPSON, RP ;

DOOLEY, GJ ;

HAAS, TW .

METALLURGICAL TRANSACTIONS, 1974, 5 (03) :585-591

[10] DIFFERENCE AUGER SPECTROSCOPY FOR STUDYING SMALL QUANTITIES OF ELEMENTS ON METALLIC SURFACES [J].

VARMA, MN ;

JOSHI, A ;

STRONGIN, M ;

RADEKA, V .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1973, 44 (11) :1643-1645

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