CORRECTIONS OF AUGER-ELECTRON SIGNAL STRENGTHS FOR MODULATION AMPLITUDE DISTORTION IN A 4-GRID RETARDING POTENTIAL-ENERGY ANALYZER

被引：18

作者：

GRANT, JT

HAAS, TW

机构：

[1] UNIVERSAL ENERGY SYST INC,MEDWAY,OH 45341

[2] USAF,AEROSP RES LABS,WRIGHT PATTERSON AFB,OH 45433

来源：

SURFACE SCIENCE | 1974年 / 44卷 / 02期

关键词：

D O I：

10.1016/0039-6028(74)90141-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

收藏

页码：617 / 623

页数：7

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[J]. SURFACE SCIENCE, 1974, 42 (01) : 1 - 11
[2] QUANTITATIVE COMPARISON OF TI AND TIO SURFACES USING AUGER-ELECTRON AND SOFT-X-RAY APPEARANCE POTENTIAL SPECTROSCOPIES
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[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (01): : 227 - 230
[3] QUANTITATIVE AUGER ANALYSIS USING INTEGRATION TECHNIQUES
GRANT, JT
HAAS, TW
HOUSTON, JE
[J]. PHYSICS LETTERS A, 1973, A 45 (04) : 309 - 310
[4] HOUSTON JB, IN PRESS
[5] EXACT CORRECTIONS FOR POTENTIAL MODULATION DISTORTION IN AUGER YIELD MEASUREMENTS
HOUSTON, JE
[J]. SURFACE SCIENCE, 1973, 38 (02) : 283 - 291
[6] RESOLUTION AND SENSITIVITY CONSIDERATIONS OF AN AUGER ELECTRON SPECTROMETER BASED ON DISPLAY LEED OPTICS
TAYLOR, NJ
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (06) : 792 - &