INTEGRATED-CIRCUIT YIELD STATISTICS

被引：216

作者：

STAPPER, CH ^{[1
]}

ARMSTRONG, FM ^{[1
]}

SAJI, K ^{[1
]}

机构：

[1] IBM CORP, E FISHKILL FACIL, DIV GEN TECHNOL, HOPEWELL JUNCTION, NY 12533 USA

来源：

PROCEEDINGS OF THE IEEE | 1983年 / 71卷 / 04期

关键词：

D O I：

10.1109/PROC.1983.12619

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

收藏

页码：453 / 470

页数：18

相关论文

共 83 条

[1] COMPUTATION OF INTEGRATED-CIRCUIT YIELDS FROM DISTRIBUTION OF SLICE YIELDS FOR INDIVIDUAL DEVICES
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[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1968, ED15 (06) : 405 - &
[2] IC YIELD PROBLEM - TENTATIVE ANALYSIS FOR MOS-SOS CIRCUITS
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[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1978, 25 (08) : 939 - 944
[3] Bindels J. F. M., 1981, 1981 IEEE International Solid-State Circuits Conference. Digest of Papers
[4] BORISOV VS, 1979, MIKROELEKTRONIKA, V8, P280
[5] AN ANALYSIS OF TRANSFORMATIONS
BOX, GEP
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[J]. JOURNAL OF THE ROYAL STATISTICAL SOCIETY SERIES B-STATISTICAL METHODOLOGY, 1964, 26 (02) : 211 - 252
[6] Cenker R. P., 1979, 1979 IEEE International Solid-State Circuits Conference (Digest of technical papers), P150
[7] FAULT-TOLERANT 64K DYNAMIC RANDOM-ACCESS MEMORY
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CLEMONS, DG
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TROUT, GM
[J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 1979, 26 (06) : 853 - 860
[8] CHANG IF, COMMUNICATION
[9] REDUNDANCY IN LSI MEMORY ARRAY
CHEN, A
[J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1969, SC 4 (05) : 291 - &
[10] DENNARD RA, COMMUNICATION

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