INTEGRATED-CIRCUIT YIELD STATISTICS

被引：216

作者：

STAPPER, CH ^{[1
]}

ARMSTRONG, FM ^{[1
]}

SAJI, K ^{[1
]}

机构：

[1] IBM CORP, E FISHKILL FACIL, DIV GEN TECHNOL, HOPEWELL JUNCTION, NY 12533 USA

来源：

关键词：

D O I：

10.1109/PROC.1983.12619

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：453 / 470

页数：18

共 83 条

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[J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1975, 10 (04) : 237 - 244
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MURPHY, BT
[J]. PROCEEDINGS OF THE IEEE, 1964, 52 (12) : 1537 - &
[49] NEW LOOK AT YIELD OF INTEGRATED CIRCUITS
MURPHY, BT
[J]. PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1971, 59 (07): : 1128 - &
[50] MURRMANN H, 1980, SIEMENS FORSCH ENTW, V9, P38