FAULT CLUSTERING - MODELING AND OBSERVATION ON EXPERIMENTAL LSI CHIPS

[1] BILOUS O, 1974, DEC P COLL INT CIRC, P199

[2] ON SOME CLUSTERING TECHNIQUES [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1964, 8 (01) : 22 - &

[3] DEFECT ANALYSIS AND YIELD DEGRADATION OF INTEGRATED-CIRCUITS [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1974, SC 9 (03) : 96 - 103

[4] CLUSTERING USING A SIMILARITY MEASURE BASED ON SHARED NEAR NEIGHBORS [J]. IEEE TRANSACTIONS ON COMPUTERS, 1973, C-22 (11) : 1025 - 1034

[5] NONPARAMETRIC VALLEY-SEEKING TECHNIQUE FOR CLUSTER ANALYSIS [J]. IEEE TRANSACTIONS ON COMPUTERS, 1972, C 21 (02) : 171 - &

[6] LAWSON TR, 1966, SEMICOND PROD SOLIDS, P22

[7] LING RF, 1971, NONR60952 CONTR

[8] LING RF, 1971, N0001467A00971104 CO

[9] MAEDER RA, 1973, Patent No. 3751047

[10] QUALITY MEASURE FOR LSI COMPONENTS [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1974, SC 9 (05) : 291 - 297

[1] BILOUS O, 1974, DEC P COLL INT CIRC, P199

[2] ON SOME CLUSTERING TECHNIQUES [J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1964, 8 (01) : 22 - &

[3] DEFECT ANALYSIS AND YIELD DEGRADATION OF INTEGRATED-CIRCUITS [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1974, SC 9 (03) : 96 - 103

[4] CLUSTERING USING A SIMILARITY MEASURE BASED ON SHARED NEAR NEIGHBORS [J]. IEEE TRANSACTIONS ON COMPUTERS, 1973, C-22 (11) : 1025 - 1034

[5] NONPARAMETRIC VALLEY-SEEKING TECHNIQUE FOR CLUSTER ANALYSIS [J]. IEEE TRANSACTIONS ON COMPUTERS, 1972, C 21 (02) : 171 - &

[6] LAWSON TR, 1966, SEMICOND PROD SOLIDS, P22

[7] LING RF, 1971, NONR60952 CONTR

[8] LING RF, 1971, N0001467A00971104 CO

[9] MAEDER RA, 1973, Patent No. 3751047

[10] QUALITY MEASURE FOR LSI COMPONENTS [J]. IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1974, SC 9 (05) : 291 - 297