DEFECT ANALYSIS AND YIELD DEGRADATION OF INTEGRATED-CIRCUITS

[1] ANSLEY WG, 1968, IEEE T ELECTRON DEVI, VED15, P405

[2] ASHAR DL, 1970, THESIS CLEMSON U

[3] BERNAY RA, 1965, ELECTRON IND, V24, P76

[4] CALHOUN DF, 1972, IEEE J SOLID-ST CIRC, VSC 7, P395

[5] DINGWALL AGF, 1968, OCT IEEE INT EL DEV

[6] STUDIES ON SURFACE PREPARATION [J]. SURFACE SCIENCE, 1969, 13 (01) : 60 - &

[7] FISHER AW, 1966, J ELECTROCHEM SOC, V113, P1054

[8] Gupta A., 1970, Proceedings of the IEEE, V58, P1960, DOI 10.1109/PROC.1970.8073

[9] GUPTA A, 1972, IEEE J SOLID ST CIRC, VSC 7, P389

[10] SILICON INSULATED-GATE FIELD-EFFECT TRANSISTOR [J]. PROCEEDINGS OF THE IEEE, 1963, 51 (09) : 1190 - &

[1] ANSLEY WG, 1968, IEEE T ELECTRON DEVI, VED15, P405

[2] ASHAR DL, 1970, THESIS CLEMSON U

[3] BERNAY RA, 1965, ELECTRON IND, V24, P76

[4] CALHOUN DF, 1972, IEEE J SOLID-ST CIRC, VSC 7, P395

[5] DINGWALL AGF, 1968, OCT IEEE INT EL DEV

[6] STUDIES ON SURFACE PREPARATION [J]. SURFACE SCIENCE, 1969, 13 (01) : 60 - &

[7] FISHER AW, 1966, J ELECTROCHEM SOC, V113, P1054

[8] Gupta A., 1970, Proceedings of the IEEE, V58, P1960, DOI 10.1109/PROC.1970.8073

[9] GUPTA A, 1972, IEEE J SOLID ST CIRC, VSC 7, P389

[10] SILICON INSULATED-GATE FIELD-EFFECT TRANSISTOR [J]. PROCEEDINGS OF THE IEEE, 1963, 51 (09) : 1190 - &