LASER ATOMIC-ABSORPTION SPECTROSCOPY APPLYING SEMICONDUCTOR DIODE-LASERS

[1] ANALYTICAL APPLICATIONS OF RESONANCE IONIZATION MASS-SPECTROMETRY (RIMS) [J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1988, 43 (12) : 1409 - 1422

[2] BACKGROUND-CORRECTED SIMULTANEOUS MULTIELEMENT ATOMIC-ABSORPTION SPECTROMETER [J]. ANALYTICAL CHEMISTRY, 1979, 51 (12) : 2007 - 2014

[3] HURST GS, 1988, SPECTORCHIM ACTA B, V43, P713

[4] LAWRENCE J, IN PRESS SPECTROCH B

[5] MEASUREMENT OF ISOTOPE RATIOS BY DOPPLER-FREE LASER SPECTROSCOPY APPLYING SEMICONDUCTOR DIODE-LASERS AND THERMIONIC DIODE DETECTION [J]. ANALYTICAL CHEMISTRY, 1987, 59 (08) : 1232 - 1236

[6] Letokhov V S, 1987, LASER PHOTOIONIZATIO

[7] ELEMENTAL ANALYSIS APPLYING HIGH-RESOLUTION AND VERY SENSITIVE LASER SPECTROSCOPY [J]. NATURWISSENSCHAFTEN, 1987, 74 (10) : 474 - 481

[8] Omenetto N., 1979, PROG ANAL AT SPECTRO, V2, P1

[9] TRAVIS JC, 1984, PROG ANAL ATOM SPECT, V7, P199

[10] 1987, LASER FOCUS, V23, P30

[1] ANALYTICAL APPLICATIONS OF RESONANCE IONIZATION MASS-SPECTROMETRY (RIMS) [J]. SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1988, 43 (12) : 1409 - 1422

[2] BACKGROUND-CORRECTED SIMULTANEOUS MULTIELEMENT ATOMIC-ABSORPTION SPECTROMETER [J]. ANALYTICAL CHEMISTRY, 1979, 51 (12) : 2007 - 2014

[3] HURST GS, 1988, SPECTORCHIM ACTA B, V43, P713

[4] LAWRENCE J, IN PRESS SPECTROCH B

[5] MEASUREMENT OF ISOTOPE RATIOS BY DOPPLER-FREE LASER SPECTROSCOPY APPLYING SEMICONDUCTOR DIODE-LASERS AND THERMIONIC DIODE DETECTION [J]. ANALYTICAL CHEMISTRY, 1987, 59 (08) : 1232 - 1236

[6] Letokhov V S, 1987, LASER PHOTOIONIZATIO

[7] ELEMENTAL ANALYSIS APPLYING HIGH-RESOLUTION AND VERY SENSITIVE LASER SPECTROSCOPY [J]. NATURWISSENSCHAFTEN, 1987, 74 (10) : 474 - 481

[8] Omenetto N., 1979, PROG ANAL AT SPECTRO, V2, P1

[9] TRAVIS JC, 1984, PROG ANAL ATOM SPECT, V7, P199

[10] 1987, LASER FOCUS, V23, P30