SURFACE EFFECTS OF SPACE RADIATION ON SILICON DEVICES

[1] REVERSIBLE CHANGES IN TRANSISTOR CHARACTERISTICS CAUSED BY SCANNING ELECTRON MICROSCOPE EXAMINATION [J]. APPLIED PHYSICS LETTERS, 1965, 6 (01) : 3 - &

[2] GROVE AS, 1965, JUN SOL STAT DEV RES

[3] HUGHES HL, 1965, 3 NAV MICR C MONT

[4] HUGHES HL, 1964, ELECTRONICS, P58

[5] HUGHES HL, 1964, 6115 NRL REP, P106

[6] KANG KD, 1964, RADCTDR64352

[7] MEASUREMENT OF MINORITY CARRIER LIFETIME AND SURFACE EFFECTS IN JUNCTION DEVICES [J]. PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1955, 43 (04): : 477 - 483

[8] SANTOPIETRO RF, 1964, 4 P PHOT SPEC C CLEV

[1] REVERSIBLE CHANGES IN TRANSISTOR CHARACTERISTICS CAUSED BY SCANNING ELECTRON MICROSCOPE EXAMINATION [J]. APPLIED PHYSICS LETTERS, 1965, 6 (01) : 3 - &

[2] GROVE AS, 1965, JUN SOL STAT DEV RES

[3] HUGHES HL, 1965, 3 NAV MICR C MONT

[4] HUGHES HL, 1964, ELECTRONICS, P58

[5] HUGHES HL, 1964, 6115 NRL REP, P106

[6] KANG KD, 1964, RADCTDR64352

[7] MEASUREMENT OF MINORITY CARRIER LIFETIME AND SURFACE EFFECTS IN JUNCTION DEVICES [J]. PROCEEDINGS OF THE INSTITUTE OF RADIO ENGINEERS, 1955, 43 (04): : 477 - 483

[8] SANTOPIETRO RF, 1964, 4 P PHOT SPEC C CLEV