GRAIN-BOUNDARIES IN SEMICONDUCTORS

[1] AST DG, 1982, GRAIN BOUNDARIES SEM, P85

[2] TRANSPORT PROPERTIES OF POLYCRYSTALLINE SILICON FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1978, 49 (11) : 5565 - 5570

[3] STRUCTURE OF GRAIN-BOUNDARIES IN GERMANIUM [J]. JOURNAL DE PHYSIQUE, 1982, 43 (NC1): : 15 - 20

[4] PARTIAL SECONDARY DISLOCATIONS IN GERMANIUM GRAIN-BOUNDARIES .1. PERIODIC NETWORK IN A SIGMA=5 COINCIDENCE BOUNDARY [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 43 (01): : 189 - 200

[5] Bartelink D. J., 1982, Grain Boundaries in Semiconductors. Proceedings of the Materials Research Society Annual Meeting, P249

[6] GRAIN-BOUNDARY DIFFUSION IN POLYCRYSTALLINE SILICON FILMS ON SIO2 [J]. JOURNAL DE PHYSIQUE, 1982, 43 (NC1): : 363 - 368

[7] Baumgart H., 1982, Grain Boundaries in Semiconductors. Proceedings of the Materials Research Society Annual Meeting, P311

[8] PARTIAL SECONDARY DISLOCATIONS IN GERMANIUM GRAIN-BOUNDARIES .2. REACTIONS WITH EXTERNAL DISLOCATIONS IN A SIGMA=25 COINCIDENCE BOUNDARY [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 43 (01): : 201 - 212

[9] LOW-ANGLE [011] TILT BOUNDARY IN GERMANIUM .2. THEORETICAL-ANALYSIS OF OBSERVED CONFIGURATIONS AND STABILITY [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1979, 39 (04): : 419 - 431

[10] LOW-ANGLE [011] TILT BOUNDARY IN GERMANIUM .1. HIGH-RESOLUTION STRUCTURE DETERMINATION [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1979, 39 (04): : 405 - 418

[1] AST DG, 1982, GRAIN BOUNDARIES SEM, P85

[2] TRANSPORT PROPERTIES OF POLYCRYSTALLINE SILICON FILMS [J]. JOURNAL OF APPLIED PHYSICS, 1978, 49 (11) : 5565 - 5570

[3] STRUCTURE OF GRAIN-BOUNDARIES IN GERMANIUM [J]. JOURNAL DE PHYSIQUE, 1982, 43 (NC1): : 15 - 20

[4] PARTIAL SECONDARY DISLOCATIONS IN GERMANIUM GRAIN-BOUNDARIES .1. PERIODIC NETWORK IN A SIGMA=5 COINCIDENCE BOUNDARY [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 43 (01): : 189 - 200

[5] Bartelink D. J., 1982, Grain Boundaries in Semiconductors. Proceedings of the Materials Research Society Annual Meeting, P249

[6] GRAIN-BOUNDARY DIFFUSION IN POLYCRYSTALLINE SILICON FILMS ON SIO2 [J]. JOURNAL DE PHYSIQUE, 1982, 43 (NC1): : 363 - 368

[7] Baumgart H., 1982, Grain Boundaries in Semiconductors. Proceedings of the Materials Research Society Annual Meeting, P311

[8] PARTIAL SECONDARY DISLOCATIONS IN GERMANIUM GRAIN-BOUNDARIES .2. REACTIONS WITH EXTERNAL DISLOCATIONS IN A SIGMA=25 COINCIDENCE BOUNDARY [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1981, 43 (01): : 201 - 212

[9] LOW-ANGLE [011] TILT BOUNDARY IN GERMANIUM .2. THEORETICAL-ANALYSIS OF OBSERVED CONFIGURATIONS AND STABILITY [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1979, 39 (04): : 419 - 431

[10] LOW-ANGLE [011] TILT BOUNDARY IN GERMANIUM .1. HIGH-RESOLUTION STRUCTURE DETERMINATION [J]. PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1979, 39 (04): : 405 - 418