NEW METHODS FOR IMAGE COLLECTION AND ANALYSIS IN SCANNING AUGER MICROSCOPY

[1] BLATNER RJ, 1980, MICROSTRUCTURAL SCI, V8, P64

[2] RATIOED SCATTER DIAGRAMS - AN EROTETIC METHOD FOR PHASE IDENTIFICATION ON COMPLEX-SURFACES USING SCANNING AUGER MICROSCOPY [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1984, 2 (04): : 1453 - 1456

[3] BROWNING R, 1983, I PHYS C SER, V68, P127

[4] GAARENSTROOM SW, 1984, APPL SURF SCI, V18, P223, DOI 10.1016/0378-5963(84)90046-1

[5] MOIK JG, 1980, NASA SP431, pCH8

[6] TECHNIQUES FOR THE CORRECTION OF TOPOGRAPHICAL EFFECTS IN SCANNING AUGER-ELECTRON MICROSCOPY [J]. JOURNAL OF APPLIED PHYSICS, 1983, 54 (01) : 374 - 381

[7] SAVOJI M H, 1983, Ultramicroscopy, V12, P1, DOI 10.1016/0304-3991(83)90299-1

[8] THORNDIKE RM, 1978, CORRELATION PROCEDUR

[9] TOWNSHEND JRG, 1984, REMOTE SENSING ENV, V5, P681

[1] BLATNER RJ, 1980, MICROSTRUCTURAL SCI, V8, P64

[2] RATIOED SCATTER DIAGRAMS - AN EROTETIC METHOD FOR PHASE IDENTIFICATION ON COMPLEX-SURFACES USING SCANNING AUGER MICROSCOPY [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1984, 2 (04): : 1453 - 1456

[3] BROWNING R, 1983, I PHYS C SER, V68, P127

[4] GAARENSTROOM SW, 1984, APPL SURF SCI, V18, P223, DOI 10.1016/0378-5963(84)90046-1

[5] MOIK JG, 1980, NASA SP431, pCH8

[6] TECHNIQUES FOR THE CORRECTION OF TOPOGRAPHICAL EFFECTS IN SCANNING AUGER-ELECTRON MICROSCOPY [J]. JOURNAL OF APPLIED PHYSICS, 1983, 54 (01) : 374 - 381

[7] SAVOJI M H, 1983, Ultramicroscopy, V12, P1, DOI 10.1016/0304-3991(83)90299-1

[8] THORNDIKE RM, 1978, CORRELATION PROCEDUR

[9] TOWNSHEND JRG, 1984, REMOTE SENSING ENV, V5, P681