CRITICAL PARAMETERS AFFECTING HOLLOW-CATHODE ION-SOURCE

[1] Birks F.T., 1954, SPECTROCHIM ACTA, V6, P169

[2] STUDIES OF SPUTTERING IN A GLOW-DISCHARGE FOR SPECTROCHEMICAL ANALYSIS [J]. ANALYTICAL CHEMISTRY, 1972, 44 (07) : 1219 - &

[3] Carter G., 1968, ION BOMBARDMENT SOLI

[4] PLASMA DIAGNOSTICS OF AN RF-SPUTTERING GLOW DISCHARGE [J]. APPLIED PHYSICS LETTERS, 1971, 18 (10) : 435 - &

[5] NEW TECHNIQUE FOR ELEMENTAL ANALYSIS OF THIN SURFACE LAYERS OF SOLIDS [J]. APPLIED PHYSICS LETTERS, 1971, 19 (09) : 350 - &

[6] HOLLOW-CATHODE IONIZATION FOR MASS-SPECTROMETRIC ANALYSIS OF CONDUCTING SOLIDS [J]. ANALYTICAL CHEMISTRY, 1974, 46 (09) : 1236 - 1242

[7] DETERMINATION OF BORON IN SOLUTION TO SUB-PPB CONCENTRATIONS BY HOLLOW-CATHODE EMISSION [J]. ANALYTICA CHIMICA ACTA, 1973, 67 (02) : 253 - 258

[8] DAUGHTREY EH, 1974, 22ND ANN C MASS SPEC

[9] DONOHUE DL, 1974, 22ND ANN C MASS SPEC

[10] FARRAR H, 1972, TRACE ANAL MASS SPEC, P265

[1] Birks F.T., 1954, SPECTROCHIM ACTA, V6, P169

[2] STUDIES OF SPUTTERING IN A GLOW-DISCHARGE FOR SPECTROCHEMICAL ANALYSIS [J]. ANALYTICAL CHEMISTRY, 1972, 44 (07) : 1219 - &

[3] Carter G., 1968, ION BOMBARDMENT SOLI

[4] PLASMA DIAGNOSTICS OF AN RF-SPUTTERING GLOW DISCHARGE [J]. APPLIED PHYSICS LETTERS, 1971, 18 (10) : 435 - &

[5] NEW TECHNIQUE FOR ELEMENTAL ANALYSIS OF THIN SURFACE LAYERS OF SOLIDS [J]. APPLIED PHYSICS LETTERS, 1971, 19 (09) : 350 - &

[6] HOLLOW-CATHODE IONIZATION FOR MASS-SPECTROMETRIC ANALYSIS OF CONDUCTING SOLIDS [J]. ANALYTICAL CHEMISTRY, 1974, 46 (09) : 1236 - 1242

[7] DETERMINATION OF BORON IN SOLUTION TO SUB-PPB CONCENTRATIONS BY HOLLOW-CATHODE EMISSION [J]. ANALYTICA CHIMICA ACTA, 1973, 67 (02) : 253 - 258

[8] DAUGHTREY EH, 1974, 22ND ANN C MASS SPEC

[9] DONOHUE DL, 1974, 22ND ANN C MASS SPEC

[10] FARRAR H, 1972, TRACE ANAL MASS SPEC, P265