SENSITIVITY OF DEFECT ENERGY-LEVELS TO HOST BAND STRUCTURES AND IMPURITY POTENTIALS IN CDTE

被引：18

作者：

CHEN, AB ^{[1
]}

SHER, A ^{[1
]}

机构：

[1] SRI INT,MENLO PK,CA 94025

来源：

PHYSICAL REVIEW B | 1985年 / 31卷 / 10期

关键词：

D O I：

10.1103/PhysRevB.31.6490

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：6490 / 6497

页数：8

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