THE NEW OXFORD SCANNING PROTON MICROPROBE ANALYTICAL FACILITY

被引：74

作者：

JAMIESON, DN

GRIME, GW

WATT, F

机构：

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1989年 / 40-1卷

关键词：

D O I：

10.1016/0168-583X(89)91072-0

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

引用

页码：669 / 674

页数：6

共 16 条

[1] POLARIZATION OF PROTONS ELASTICALLY SCATTERED BY OXYGEN [J].

BLUE, RA ;

HAEBERLI, W .

PHYSICAL REVIEW, 1965, 137 (2B) :B284-&

[2] ALGORITHMS FOR THE RAPID SIMULATION OF RUTHERFORD BACKSCATTERING SPECTRA [J].

DOOLITTLE, LR .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1985, 9 (03) :344-351

[3] SOFTWARE MASKING FOR THE ACCURATE DETERMINATION OF ELEMENTAL QUANTITIES IN DISCRETE AREAS OF A MICRO-PIXE SCAN [J].

GRIME, GW ;

WATT, F .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1988, 30 (03) :300-302

[4] FOCUSING PROTONS AND LIGHT-IONS TO MICRON AND SUB-MICRON DIMENSIONS [J].

GRIME, GW ;

WATT, F .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1988, 30 (03) :227-234

[5] ABERRATIONS OF SINGLE MAGNETIC QUADRUPOLE LENSES [J].

JAMIESON, DN ;

LEGGE, GJF .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1987, 29 (03) :544-556

[6]

JAMIESON DN, 1988, NUCL INSTRUM METH B, V34, P396

[7] SIMULTANEOUS COMPENSATION OF 2ND-ORDER PARASITIC ABERRATIONS IN BOTH PRINCIPAL SECTIONS OF AN ACHROMATIC QUADRUPOLE LENS DOUBLET [J].

MARTIN, FW ;

GOLOSKIE, R .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1988, 30 (03) :242-247

[8]

Parzen G., 1976, BNL50536

[9] FOCUSED MEV BEAM LINE FOR MICROANALYSIS AT OSAKA [J].

TAKAI, M ;

KINOMURA, A ;

INOUE, K ;

MATSUNAGA, K ;

IZUMI, M ;

GAMO, K ;

NAMBA, S ;

SATOU, M .

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1988, 30 (03) :260-264

[10] LEVELS OF P-29 FROM SI-28(P,P)SI-28 AND SI-28(P,P')SI-28 [J].

VORONA, J ;

OLNESS, JW ;

HAEBERLI, W ;

LEWIS, HW .

PHYSICAL REVIEW, 1959, 116 (06) :1563-1571

← 1 2 →