A SYSTEMATIC ANALYSIS OF HREM IMAGING OF ELEMENTAL SEMICONDUCTORS

被引：24

作者：

GLAISHER, RW

SPARGO, AEC

SMITH, DJ

机构：

[1] ARIZONA STATE UNIV,DEPT PHYS,TEMPE,AZ 85287

[2] UNIV MELBOURNE,SCH PHYS,PARKVILLE,VIC 3052,AUSTRALIA

来源：

关键词：

D O I：

10.1016/0304-3991(89)90199-X

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：35 / 51

页数：17

共 10 条

[1] BOURRET A, 1978, CHEM SCRIPTA, V14, P207
[2] ASPECTS OF HREM OF TETRAHEDRAL SEMICONDUCTORS
GLAISHER, RW
SPARGO, AEC
[J]. ULTRAMICROSCOPY, 1985, 18 (1-4) : 323 - 334
[3] A SYSTEMATIC ANALYSIS OF HREM IMAGING OF SPHALERITE SEMICONDUCTORS
GLAISHER, RW
SPARGO, AEC
SMITH, DJ
[J]. ULTRAMICROSCOPY, 1989, 27 (02) : 131 - 150
[4] A THEORETICAL-ANALYSIS OF HREM IMAGING FOR (110) TETRAHEDRAL SEMICONDUCTORS
GLAISHER, RW
SPARGO, AEC
SMITH, DJ
[J]. ULTRAMICROSCOPY, 1989, 27 (01) : 19 - 34
[5] A SYSTEMATIC ANALYSIS OF HREM IMAGING OF WURTZITE SEMICONDUCTORS
GLAISHER, RW
SPARGO, AEC
SMITH, DJ
[J]. ULTRAMICROSCOPY, 1989, 27 (02) : 117 - 130
[6] KRIVANEK OL, 1976, OPTIK, V45, P97
[7] THE IMPORTANCE OF BEAM ALIGNMENT AND CRYSTAL TILT IN HIGH-RESOLUTION ELECTRON-MICROSCOPY
SMITH, DJ
SAXTON, WO
OKEEFE, MA
WOOD, GJ
STOBBS, WM
[J]. ULTRAMICROSCOPY, 1983, 11 (04) : 263 - 281
[8] SMITH DJ, 1986, JEOL NEWS E, V22, P2
[9] WILSON AR, 1982, OPTIK, V61, P63
[10] [No title captured]