RAMAN-SPECTROSCOPY CHARACTERIZATION OF POLYCRYSTALLINE GAP THIN-FILMS GROWN BY MO-CVD PROCESS USING [ET2GA-PET2]3 AS ONLY SOURCE

被引：13

作者：

MAURY, F ^{[1
]}

COMBES, M ^{[1
]}

CONSTANT, G ^{[1
]}

CARLES, R ^{[1
]}

RENUCCI, JB ^{[1
]}

机构：

[1] UNIV TOULOUSE 3,PHYS SOLIDES LAB 74,F-31062 TOULOUSE,FRANCE

来源：

JOURNAL DE PHYSIQUE | 1982年 / 43卷 / NC1期

关键词：

D O I：

10.1051/jphyscol:1982146

中图分类号：

学科分类号：

摘要：

引用

页码：347 / 352

页数：6

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