NUMERICAL DERIVATIVE ANALYSIS OF THE PSEUDODIELECTRIC FUNCTION OF CDTE

被引:19
作者
KIMURA, T
ADACHI, S
机构
[1] Department of Electronic Engineering, Gunma University, Kiryu-shi, Gunma
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1993年 / 32卷 / 6A期
关键词
CDTE; DIELECTRIC FUNCTION; DIELECTRIC CONSTANT; SPECTROSCOPIC ELLIPSOMETRY; CRITICAL POINT; EXCITON;
D O I
10.1143/JJAP.32.2740
中图分类号
O59 [应用物理学];
学科分类号
摘要
The real (epsilon1) and imaginary (epsilon2) parts of the dielectric function for CdTe have been measured by spectroscopic ellipsometry in the 1.1-5.6-eV photon-energy range at room temperature. The measured spectra reveal distinct structures at energies of the E0, E0+DELTA0, E1, E1+DELTA1 and E2 oritical points (CPs). These data are analyzed by fitting the first-(depsilon/dE) or second-derivative spectra (d2epsilon/dE2) with model dielectric functions (MDF) or standard critical-point (SCP) line shapes. It is found that both the MDF and SCP models successfully explain the measured derivative spectra. The MDF also shows excellent agreement with the experimental epsilon(omega) spectra, but the SCP does not. The CP energies determined here are: E0=1.58 eV; E0+DELTA0=2.55 eV; E1=3.55 eV; E1+DELTA1=4.13 eV; and E2=5.13 eV.
引用
收藏
页码:2740 / 2745
页数:6
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