THERMAL-STABILITY OF MULTILAYER FILMS PT/SI, W/SI, MO/SI, AND W/C

被引：72

作者：

JIANG, ZM

JIANG, XM

LIU, WH

WU, ZQ

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1989年 / 65卷 / 01期

关键词：

D O I：

10.1063/1.342569

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：196 / 200

页数：5

共 16 条

[1]

BRAUNSTEIN G, 1984, 1983 MRS S ION IMPL, V27, P475

[2] THE EFFECT OF INTERFACE ROUGHNESS ON THE INTENSITY PROFILES OF BRAGG PEAKS FROM SUPERLATTICES [J].

CHRZAN, D ;

DUTTA, P .

JOURNAL OF APPLIED PHYSICS, 1986, 59 (05) :1504-1507

[3]

JIANG X, IN PRESS ACTA PHYS S

[4]

Jiang Xiaoming, 1986, Chinese Physics Letters, V3, P569, DOI 10.1088/0256-307X/3/12/011

[5] ANOMALOUS EXPANSION OF TUNGSTEN-CARBON MULTILAYERS USED IN X-RAY OPTICS [J].

LEPETRE, Y ;

ZIEGLER, E ;

SCHULLER, IK ;

RIVOIRA, R .

JOURNAL OF APPLIED PHYSICS, 1986, 60 (07) :2301-2303

[6]

LU JB, IN PRESS ACTA PHYS S

[7] MICROSTRUCTURAL INVESTIGATIONS OF REFRACTORY-METAL SILICIDE FILMS ON SILICON [J].

MAGEE, TJ ;

WOOLHOUSE, GR ;

KAWAYOSHI, HA ;

NIEMEYER, IC ;

RODRIGUES, B ;

ORMOND, RD .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1984, 2 (04) :756-761

[8] 1ST-ORDER AND 2ND-ORDER RAMAN-SCATTERING FROM FINITE-SIZE CRYSTALS OF GRAPHITE [J].

NEMANICH, RJ ;

SOLIN, SA .

PHYSICAL REVIEW B, 1979, 20 (02) :392-401

[9]

ONG CK, 1985, MATER RES SOC S P, V35, P239

[10] RAMAN-SCATTERING FROM EXTREMELY THIN HARD AMORPHOUS-CARBON FILMS [J].

RAMSTEINER, M ;

WAGNER, J ;

WILD, C ;

KOIDL, P .

JOURNAL OF APPLIED PHYSICS, 1987, 62 (02) :729-731

← 1 2 →