X-RAY REFLECTION AND TRANSMISSION BY ROUGH SURFACES

被引：67

作者：

DEBOER, DKG

机构：

[1] Philips Research Laboratories, 5656 AA Eindhoven

来源：

PHYSICAL REVIEW B | 1995年 / 51卷 / 08期

关键词：

D O I：

10.1103/PhysRevB.51.5297

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Expressions are given for the coherent (specular) and incoherent (diffuse) reflection and transmission of x rays by rough surfaces. In particular, the results from the distorted-wave Born approximation are critically compared with those obtained by us using the Rayleigh method. It is shown that the validity of the various expressions depends on the values of the perpendicular wave vector, the root-mean-square surface roughness, and the lateral correlation length of the roughness. The conservation of intensity in the various approximations is considered. © 1995 The American Physical Society.

引用

页码：5297 / 5305

页数：9

共 29 条

[1]

Beckmann P., 1963, SCATTERING ELECTROMA

[2]

CATICHA A, UNPUB

[3]

CATICHA A, 1994, PHYSICS XRAY MULTILA, V6, P56

[4]

Church E. L., 1986, Proceedings of the SPIE - The International Society for Optical Engineering, V645, P107, DOI 10.1117/12.964495

[5]

CROCE P, 1972, CR ACAD SCI B PHYS, V274, P803

[6]

CROCE P, 1972, CR ACAD SCI B PHYS, V274, P855

[7] UTILIZATION OF SPECULAR X-RAY REFLECTION, DIFFUSE X-RAY REFLECTION OR PLANAR X-RAY REFLECTION TO STUDY THIN-FILMS OR SURFACES [J].

CROCE, P ;

NEVOT, L .

REVUE DE PHYSIQUE APPLIQUEE, 1976, 11 (01) :113-125

[8]

CROCE P, 1972, NOUV REV OPTIQUE APP, V3, P37

[9] INFLUENCE OF THE ROUGHNESS PROFILE ON THE SPECULAR REFLECTIVITY OF X-RAYS AND NEUTRONS [J].

DEBOER, DKG .

PHYSICAL REVIEW B, 1994, 49 (09) :5817-5820

[10] GLANCING-INCIDENCE X-RAY-FLUORESCENCE OF LAYERED MATERIALS [J].

DEBOER, DKG .

PHYSICAL REVIEW B, 1991, 44 (02) :498-511

← 1 2 3 →