X-RAY REFLECTION AND TRANSMISSION BY ROUGH SURFACES

被引:67
作者
DEBOER, DKG
机构
[1] Philips Research Laboratories, 5656 AA Eindhoven
来源
PHYSICAL REVIEW B | 1995年 / 51卷 / 08期
关键词
D O I
10.1103/PhysRevB.51.5297
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Expressions are given for the coherent (specular) and incoherent (diffuse) reflection and transmission of x rays by rough surfaces. In particular, the results from the distorted-wave Born approximation are critically compared with those obtained by us using the Rayleigh method. It is shown that the validity of the various expressions depends on the values of the perpendicular wave vector, the root-mean-square surface roughness, and the lateral correlation length of the roughness. The conservation of intensity in the various approximations is considered. © 1995 The American Physical Society.
引用
收藏
页码:5297 / 5305
页数:9
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