ARSENIC-TERMINATED SILICON AND GERMANIUM SURFACES STUDIED BY SCANNING TUNNELLING MICROSCOPY

被引：100

作者：

BECKER, RS

KLITSNER, T

VICKERS, JS

机构：

来源：

JOURNAL OF MICROSCOPY-OXFORD | 1988年 / 152卷

关键词：

D O I：

10.1111/j.1365-2818.1988.tb01374.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：157 / 165

页数：9

共 25 条

[11] SCANNING TUNNELING MICROSCOPY OF SI(001)
HAMERS, RJ
TROMP, RM
DEMUTH, JE
[J]. PHYSICAL REVIEW B, 1986, 34 (08): : 5343 - 5357
[12] MANY-BODY CALCULATION OF SURFACE-STATES - AS ON GE(111)
HYBERTSEN, MS
LOUIE, SG
[J]. PHYSICAL REVIEW LETTERS, 1987, 58 (15) : 1551 - 1554
[13] HYBERTSEN MS, 1988, PHYS REV B AUG
[14] ISHIZAKA A, 1982, 2ND P INT S MOL BEAM, P183
[15] TUNNELING MICROSCOPY OF GE(001)
KUBBY, JA
GRIFFITH, JE
BECKER, RS
VICKERS, JS
[J]. PHYSICAL REVIEW B, 1987, 36 (11): : 6079 - 6093
[16] NEW SURFACE-STATES ON THE ANNEALED GE(111) SURFACE
NICHOLLS, JM
HANSSON, GV
UHRBERG, RIG
FLODSTROM, SA
[J]. PHYSICAL REVIEW B, 1986, 33 (08): : 5555 - 5559
[17] ARSENIC OVERLAYER ON SI(111) - REMOVAL OF SURFACE RECONSTRUCTION
OLMSTEAD, MA
BRINGANS, RD
UHRBERG, RIG
BACHRACH, RZ
[J]. PHYSICAL REVIEW B, 1986, 34 (08): : 6041 - 6044
[18] ARSENIC ATOM LOCATION ON PASSIVATED SILICON (111) SURFACES
PATEL, JR
GOLOVCHENKO, JA
FREELAND, PE
GOSSMANN, HJ
[J]. PHYSICAL REVIEW B, 1987, 36 (14): : 7715 - 7717
[19] IMAGING ELECTRONIC SURFACE-STATES IN REAL SPACE ON THE SI(111)2X1 SURFACE
STROSCIO, JA
FEENSTRA, RM
FEIN, AP
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1987, 5 (04): : 838 - 841
[20] STRUCTURAL-ANALYSIS OF SI(111)-7X7 BY UHV-TRANSMISSION ELECTRON-DIFFRACTION AND MICROSCOPY
TAKAYANAGI, K
TANISHIRO, Y
TAKAHASHI, M
TAKAHASHI, S
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1985, 3 (03): : 1502 - 1506