EL2 RELATED LEVELS IN GAAS-SI - TRANSMISSION AND DISPERSION IN INFRARED IMAGING

被引:9
作者
CASTAGNE, M
FILLARD, JP
BONNAFE, J
机构
[1] Univ de Montpellier 2 (Univ des, Sciences et Techniques du, Languedoc), Cent d'Electronique de, Univ de Montpellier 2 (Univ des Sciences et Techniques du Languedoc), Cent d'Electronique de Montpe
关键词
D O I
10.1016/0038-1098(85)90099-7
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
34
引用
收藏
页码:653 / 656
页数:4
相关论文
共 34 条
  • [1] Blakemore J. S., 1982, J APPL PHYS, V52, p123(R)
  • [2] COLLECTIVE INVESTIGATIONS ON 2 TYPICAL SEMI-INSULATING GAAS INGOTS
    BONNAFE, J
    CASTAGNE, M
    CLERJAUD, B
    DEVEAUD, B
    FAVENNEC, PN
    FILLARD, JP
    GAUNEAU, M
    GOLTZENE, A
    GUENAIS, B
    GUILLOT, G
    HENNEL, AM
    HUBER, AM
    JOUGLAR, J
    LEYRAL, P
    MANIFACIER, JC
    MARTINEZ, G
    PICOLI, G
    ROIZES, A
    SCHWAB, C
    VISENTIN, N
    VUILLERMOZ, PL
    [J]. MATERIALS RESEARCH BULLETIN, 1981, 16 (10) : 1193 - 1212
  • [3] BROWN GT, 1984, 3 5 SEM INS MAT C KA
  • [4] DIRECT OBSERVATION OF FINE-STRUCTURE IN THE CONCENTRATION OF THE DEEP DONOR [EL2] AND ITS CORRELATION WITH DISLOCATIONS IN UNDOPED, SEMI-INSULATING GAAS
    BROZEL, MR
    GRANT, I
    WARE, RM
    STIRLAND, DJ
    SKOLNICK, MS
    [J]. JOURNAL OF APPLIED PHYSICS, 1984, 56 (04) : 1109 - 1118
  • [5] DIRECT OBSERVATION OF THE PRINCIPAL DEEP LEVEL (EL2) IN UNDOPED SEMI-INSULATING GAAS
    BROZEL, MR
    GRANT, I
    WARE, RM
    STIRLAND, DJ
    [J]. APPLIED PHYSICS LETTERS, 1983, 42 (07) : 610 - 612
  • [6] BROZEL MR, 1984, 11TH INT S GAAS REL
  • [7] CHAFAI M, 1982, THESIS MONTPELLIER
  • [8] DOBRELLA P, 1984, 3 5 SEM INS MAT C KA
  • [9] THERMAL REGENERATION OF THE EL2 CENTER UNQUENCHED CONFIGURATION IN SEMI-INSULATING GAAS
    FILLARD, JP
    BONNAFE, J
    CASTAGNE, M
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1984, 35 (03): : 149 - 153
  • [10] DIRECT EVIDENCE FOR A CHARGE-CONTROLLED DIPOLAR STRUCTURE OF THE EL2 COMPLEX CENTER IN SEMI-INSULATING GAAS
    FILLARD, JP
    BONNAFE, J
    CASTAGNE, M
    [J]. JOURNAL OF APPLIED PHYSICS, 1984, 56 (10) : 3020 - 3021