TOPOGRAPHIC OBSERVATION OF MICRO DEFECTS (EG SWIRLS) IN NEARLY PERFECT CRYSTALS

被引:46
作者
RENNINGER, M [1 ]
机构
[1] UNIV MARBURG,INTERFERENZOPTIK ABT,MARBURG,BUNDES REPUBLIK
关键词
D O I
10.1107/S0021889876010820
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
引用
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页码:178 / 180
页数:3
相关论文
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[2]   NEW X-RAY TOPOGRAPHIC TECHNIQUE FOR DETECTION OF SMALL DEFECTS IN HIGHLY PERFECT CRYSTALS [J].
CHIKAWA, JI ;
ASAEDA, Y ;
FUJIMOTO, I .
JOURNAL OF APPLIED PHYSICS, 1970, 41 (05) :1922-&
[3]  
RENNINGER M, 1965, Z ANGEW PHYSIK, V19, P20
[4]  
RENNINGER M, 1964, Z NATURFORSCH PT A, VA 19, P783