DETECTION OF X-RAYS AND ELECTRON-ENERGY LOSS EVENTS IN TIME COINCIDENCE

被引：31

作者：

KRUIT, P

SHUMAN, H

SOMLYO, AP

机构：

来源：

ULTRAMICROSCOPY | 1984年 / 13卷 / 03期

关键词：

D O I：

10.1016/0304-3991(84)90199-2

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

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页码：205 / 213

页数：9

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