PRE-SPECTROMETER OPTICS IN A CTEM-STEM

被引：18

作者：

JOHNSON, DE

机构：

来源：

关键词：

D O I：

10.1016/0304-3991(80)90022-4

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

引用

页码：163 / 174

页数：12

共 13 条

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EGERTON, RF
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[3] EGERTON RF, SCANNING ELECTRON MI
[4] FERT C, 1967, FOCUSING CHARGED PAR, V1, P309
[5] HAINE ME, 1961, ELECTRON MICROSCOPE
[6] MICROANALYSIS OF LIGHT-ELEMENTS USING TRANSMITTED ENERGY-LOSS ELECTRONS
ISAACSON, M
JOHNSON, D
[J]. ULTRAMICROSCOPY, 1975, 1 (01) : 33 - 52
[7] ELECTRON MICROSPECTROSCOPY
ISAACSON, MS
CREWE, AV
[J]. ANNUAL REVIEW OF BIOPHYSICS AND BIOENGINEERING, 1975, 4 : 165 - 184
[8] BASIC ASPECTS OF ENERGY-LOSS SPECTROMETER SYSTEMS
JOHNSON, DE
[J]. ULTRAMICROSCOPY, 1978, 3 (04) : 361 - 365
[9] JOHNSON DE, REV SCI INSTR
[10] JOHNSON DE, SCANNING ELECTRON MI