FINGERPRINT SPECTRA IN LASER MICROPROBE MASS ANALYSIS OF TITANIUM-OXIDES OF DIFFERENT STOICHIOMETRY

被引:35
作者
MICHIELS, E
GIJBELS, R
机构
关键词
D O I
10.1016/0584-8547(83)80079-2
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
引用
收藏
页码:1347 / 1354
页数:8
相关论文
共 15 条
[1]  
BRUYNSEELS F, UNPUB ANAL CHEM
[2]   MOLECULAR ION DISTRIBUTIONS IN LASER MICROPROBE MASS-SPECTROMETRY OF CALCIUM-OXIDE AND CALCIUM SALTS [J].
BRUYNSEELS, FJ ;
VANGRIEKEN, RE .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1983, 38 (5-6) :853-858
[3]  
DENOYER E, 1982, ANAL CHEM, V54, pA26
[4]   LASER MICRO-PROBE MASS-SPECTROMETRY .2. APPLICATIONS TO STRUCTURAL-ANALYSIS [J].
HERCULES, DM ;
DAY, RJ ;
BALASANMUGAM, K ;
DANG, TA ;
LI, CP .
ANALYTICAL CHEMISTRY, 1982, 54 (02) :A280-&
[5]   SESSIONS OF LAMMA-SYMPOSIUM, DUSSELDORF, OCTOBER 8-10, 1980 - INTRODUCTION TO THIS SPECIAL ISSUE [J].
HILLENKAMP, F ;
KAUFMANN, R .
FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1981, 308 (03) :193-194
[6]   ANALYTICAL CAPABILITIES OF LASER-PROBE MASS-SPECTROMETRY [J].
KOVALEV, ID ;
MAKSIMOV, GA ;
SUCHKOV, AI ;
LARIN, NV .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1978, 27 (02) :101-137
[7]   ATOMIC AND MOLECULAR ION EMISSION FROM SILICA IN LASER MICROPROBE MASS ANALYSIS (LAMMA) - COMPARISON WITH SECONDARY ION MASS-SPECTROMETRY (SIMS) AND SPARK SOURCE-MASS SPECTROMETRY (SSMS) [J].
MICHIELS, E ;
CELIS, A ;
GIJBELS, R .
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1983, 47 (JAN) :23-26
[8]  
MICHIELS E, 1982, MICROBEAM ANAL 1982, P383
[9]   EMPIRICAL FORMULA FOR CALCULATION OF SECONDARY ION YIELDS FROM OXIDIZED METAL-SURFACES AND METAL-OXIDES [J].
PLOG, C ;
WIEDMANN, L ;
BENNINGHOVEN, A .
SURFACE SCIENCE, 1977, 67 (02) :565-580
[10]   REFRACTIVE-INDEXES OF TIO2 FILMS PRODUCED BY REACTIVE EVAPORATION OF VARIOUS TITANIUM-OXYGEN PHASES [J].
PULKER, HK ;
PAESOLD, G ;
RITTER, E .
APPLIED OPTICS, 1976, 15 (12) :2986-2991