X-RAY-SENSITIVITY OF HALOGENATED A-SE-AS PHOTORECEPTORS FOR ELECTRORADIOGRAPHY

被引：7

作者：

AIYAH, V ^{[1
]}

BAILLIE, A ^{[1
]}

POLISCHUK, B ^{[1
]}

BEKIROV, A ^{[1
]}

KASAP, SO ^{[1
]}

机构：

[1] SASKATOON CANC CTR,SASKATOON S7N 4H4,SASKATCHEWAN,CANADA

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1991年 / 137卷

关键词：

D O I：

10.1016/S0022-3093(05)80371-0

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

The present work reports measurements on the x-ray sensitivity of Cl doped a-Se:0.1-0.3%As x-ray receptor films as a function of electric field, film thickness, and electron and hole schubwegs.

引用

页码：1337 / 1340

页数：4

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