GLASS SURFACE ANALYSIS BY AUGER-ELECTRON SPECTROSCOPY

被引：68

作者：

PANTANO, CG ^{[1
]}

DOVE, DB ^{[1
]}

ONODA, GY ^{[1
]}

机构：

[1] UNIV FLORIDA,DEPT MAT SCI & ENGN,GAINESVILLE,FL 32611

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1975年 / 19卷 / DEC期

关键词：

D O I：

10.1016/0022-3093(75)90068-X

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

收藏

页码：41 / 53

页数：13

相关论文

共 23 条

[1] CHANG CC, 1974, CHARACTERIZATION SOL
[2] AUGER AND ELLIPSOMETRIC STUDY OF PHOSPHORUS SEGREGATION IN OXIDIZED DEGENERATE SILICON
CHOU, NJ
VANDERME.YJ
HAMMER, R
CAHILL, J
[J]. APPLIED PHYSICS LETTERS, 1974, 24 (04) : 200 - 202
[3] AUGER ANALYSIS OF CHLORINE IN HCL-GROWN, OR CL2-GROWN SIO2 FILMS
CHOU, NJ
OSBURN, CM
VANDERME.YJ
HAMMER, R
[J]. APPLIED PHYSICS LETTERS, 1973, 22 (08) : 380 - 381
[4] CLARK AE, 1975, THESIS U FLORIDA
[5] CLARK AE, 1975, J BIOMED MAT RES APR
[6] CLARK AF, TO BE PUBLISHED
[7] DETERMINATION OF COMPOSITION OF GLASS SURFACES BY AUGER SPECTROSCOPY
GOLDSTEIN, B
CARLSON, DE
[J]. JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1972, 55 (01) : 51 - +
[8] QUANTITATIVE AUGER ANALYSIS USING INTEGRATION TECHNIQUES
GRANT, JT
HAAS, TW
HOUSTON, JE
[J]. PHYSICS LETTERS A, 1973, A 45 (04) : 309 - 310
[9] SOME APPLICATIONS OF AUGER-ELECTRON SPECTROSCOPY TO METALLURGICAL PROBLEMS
HAAS, TW
POCKER, DJ
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1974, 11 (06): : 1087 - 1092
[10] OXYGEN OUTGASSING CAUSED BY ELECTRON BOMBARDMENT OF GLASS
LINEWEAVER, JL
[J]. JOURNAL OF APPLIED PHYSICS, 1963, 34 (06) : 1786 - &