EFFECT OF DAMAGE ON SELECTIVITY IN SEMICONDUCTOR ELECTRODE-REACTIONS

被引:9
作者
LI, B [1 ]
MORRISON, SR [1 ]
机构
[1] SIMON FRASER UNIV,ENERGY RES INST,BURNABY V5A 1S6,BC,CANADA
关键词
D O I
10.1021/j100255a053
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:1804 / 1809
页数:6
相关论文
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