ION MILLING OF MATERIALS SCIENCE SPECIMENS FOR ELECTRON-MICROSCOPY - A REVIEW

[11] ERLICH JJP, 1971, RAD EFFECTS, V8, P1

[12] FLUIT JM, 1962, INT S NSRC

[13] Frank F.C., 1958, GROWTH PERFECTION CR, P6

[14] SADDLE FIELD-ION SOURCE OF SPHERICAL CONFIGURATION FOR ETCHING AND THINNING APPLICATIONS [J]. VACUUM, 1974, 24 (10) : 489 - 491

[15] FRANKS J, 1978, ADV ELECTRON EL PHYS, V47, P1

[16] Gurmin B. M., 1969, Bulletin of the Academy of Sciences of the USSR, Physical Series, V33, P752

[17] CONDITIONS FOR TOTAL REFLECTION OF LOW-ENERGY ATOMS FROM CRYSTAL-SURFACES [J]. APPLIED PHYSICS, 1978, 17 (04): : 371 - 375

[18] Kelly R., 1973, Radiation Effects, V19, P39, DOI 10.1080/00337577308232213

[19] ON THE ORIGIN OF PYRAMIDS AND CONES ON ION-BOMBARDED COPPER SURFACES [J]. SURFACE SCIENCE, 1980, 100 (01) : 135 - 153

[20] ION NEUTRALIZATION PROCESSES AT INSULATOR SURFACES AND CONSEQUENT IMPURITY MIGRATION EFFECTS IN SIO2 FILMS [J]. PHYSICAL REVIEW LETTERS, 1973, 30 (13) : 614 - 617

[11] ERLICH JJP, 1971, RAD EFFECTS, V8, P1

[12] FLUIT JM, 1962, INT S NSRC

[13] Frank F.C., 1958, GROWTH PERFECTION CR, P6

[14] SADDLE FIELD-ION SOURCE OF SPHERICAL CONFIGURATION FOR ETCHING AND THINNING APPLICATIONS [J]. VACUUM, 1974, 24 (10) : 489 - 491

[15] FRANKS J, 1978, ADV ELECTRON EL PHYS, V47, P1

[16] Gurmin B. M., 1969, Bulletin of the Academy of Sciences of the USSR, Physical Series, V33, P752

[17] CONDITIONS FOR TOTAL REFLECTION OF LOW-ENERGY ATOMS FROM CRYSTAL-SURFACES [J]. APPLIED PHYSICS, 1978, 17 (04): : 371 - 375

[18] Kelly R., 1973, Radiation Effects, V19, P39, DOI 10.1080/00337577308232213

[19] ON THE ORIGIN OF PYRAMIDS AND CONES ON ION-BOMBARDED COPPER SURFACES [J]. SURFACE SCIENCE, 1980, 100 (01) : 135 - 153

[20] ION NEUTRALIZATION PROCESSES AT INSULATOR SURFACES AND CONSEQUENT IMPURITY MIGRATION EFFECTS IN SIO2 FILMS [J]. PHYSICAL REVIEW LETTERS, 1973, 30 (13) : 614 - 617