DETERMINATION OF DIFFUSION LENGTH OF SOLAR-CELLS

被引：3

作者：

SCHEER, HC

WAGEMANN, HG

机构：

来源：

ARCHIV FUR ELEKTROTECHNIK | 1983年 / 66卷 / 5-6期

关键词：

D O I：

10.1007/BF01452353

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：327 / 334

页数：8

共 18 条

[1] DIFFUSION LENGTH DETERMINATION IN P-N-JUNCTION DIODES AND SOLAR-CELLS [J].

ARORA, ND ;

CHAMBERLAIN, SG ;

ROULSTON, DJ .

APPLIED PHYSICS LETTERS, 1980, 37 (03) :325-327

[2]

BOHM M, THESIS TU BERLIN

[3]

BOHM M, UNPUB SOL CELLS

[4] DETERMINATION OF MINORITY-CARRIER LIFETIME IN SILICON SOLAR-CELLS FROM LASER-TRANSIENT PHOTO-VOLTAIC EFFECT [J].

DIGIULIO, M ;

GALASSINI, S ;

MICOCCI, G ;

TEPORE, A ;

MANFREDOTTI, C .

JOURNAL OF APPLIED PHYSICS, 1981, 52 (12) :7219-7223

[5] ELECTRON-HOLE RECOMBINATION IN GERMANIUM [J].

HALL, RN .

PHYSICAL REVIEW, 1952, 87 (02) :387-387

[6]

LOFERSKI JJ, 1961, RCA REV, V22, P38

[7]

MOORE AR, 1980, RCA REV, V40, P549

[8] DIFFUSION LENGTH AND LIFETIME DETERMINATION IN P-N-JUNCTION SOLAR-CELLS AND DIODES BY FORWARD-BIASED CAPACITANCE MEASUREMENTS [J].

NEUGROSCHEL, A ;

CHEN, PJ ;

PAO, SC ;

LINDHOLM, FA .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1978, 25 (04) :485-490

[9] DETERMINATION OF LIFETIMES AND RECOMBINATION CURRENTS IN P-N-JUNCTION SOLAR-CELLS, DIODES, AND TRANSISTORS [J].

NEUGROSCHEL, A .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1981, 28 (01) :108-115

[10] MEASUREMENT OF DIFFUSION LENGTH IN SOLAR CELLS [J].

REYNOLDS, JH ;

MEULENBERG, A .

JOURNAL OF APPLIED PHYSICS, 1974, 45 (06) :2582-2592

← 1 2 →